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 Freescale Semiconductor Technical Data
Document Number: MRF5S21090H Rev. 3, 10/2008
N--Channel Enhancement--Mode Lateral MOSFETs
Designed for W--CDMA base station applications with frequencies from 2110 to 2170 MHz. Suitable for TDMA, CDMA and multicarrier amplifier applicat i o n s . To b e u s e d i n C l a s s A B f o r P C N -- P C S / c e l l u l a r r a d i o a n d W L L applications. * Typical 2--carrier W--CDMA Performance: VDD = 28 Volts, IDQ = 850 mA, Pout = 19 Watts Avg., f = 2112.5 MHz, Channel Bandwidth = 3.84 MHz, PAR = 8.5 dB @ 0.01% Probability on CCDF. Power Gain -- 14.5 dB Drain Efficiency -- 26% IM3 @ 10 MHz Offset -- --37.5 dBc in 3.84 MHz Channel Bandwidth ACPR @ 5 MHz Offset -- --40.5 dBc in 3.84 MHz Channel Bandwidth * Capable of Handling 10:1 VSWR, @ 28 Vdc, 2140 MHz, 90 Watts CW Output Power Features * Characterized with Series Equivalent Large--Signal Impedance Parameters * Internally Matched for Ease of Use * Qualified Up to a Maximum of 32 VDD Operation * Integrated ESD Protection * Lower Thermal Resistance Package * Low Gold Plating Thickness on Leads, 40 Nominal. * RoHS Compliant * In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
MRF5S21090HR3 MRF5S21090HSR3
2110-2170 MHz, 19 W AVG., 28 V 2 x W-CDMA LATERAL N-CHANNEL RF POWER MOSFETs
CASE 465-06, STYLE 1 NI-780 MRF5S21090HR3
CASE 465A-06, STYLE 1 NI-780S MRF5S21090HSR3
Table 1. Maximum Ratings
Rating Drain--Source Voltage Gate--Source Voltage Total Device Dissipation @ TC = 25C Derate above 25C Storage Temperature Range Case Operating Temperature Operating Junction Temperature Symbol VDSS VGS PD Tstg TC TJ Value --0.5, +65 --0.5, +15 269 1.5 --65 to +150 150 200 Unit Vdc Vdc W W/C C C C
Table 2. Thermal Characteristics
Characteristic Thermal Resistance, Junction to Case Case Temperature 80C, 90 W CW Case Temperature 76C, 19 W CW Symbol RJC 0.65 0.69 Value (1,2) Unit C/W
1. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955.
(c) Freescale Semiconductor, Inc., 2008. All rights reserved.
MRF5S21090HR3 MRF5S21090HSR3 1
RF Device Data Freescale Semiconductor
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
RF Power Field Effect Transistors
LIFETIME BUY
Table 3. ESD Protection Characteristics
Test Conditions Human Body Model Machine Model Charge Device Model Class 1 (Minimum) M3 (Minimum) C7 (Minimum)
Table 4. Electrical Characteristics (TC = 25C unless otherwise noted)
Characteristic Off Characteristics Zero Gate Voltage Drain Leakage Current (VDS = 65 Vdc, VGS = 0 Vdc) Zero Gate Voltage Drain Leakage Current (VDS = 28 Vdc, VGS = 0 Vdc) Gate--Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) IDSS IDSS IGSS -- -- -- -- -- -- 10 1 1 Adc Adc Adc Symbol Min Typ Max Unit
LIFETIME BUY
On Characteristics (DC) Gate Threshold Voltage (VDS = 10 Vdc, ID = 200 Adc) Gate Quiescent Voltage (VDS = 28 Vdc, ID = 850 mAdc) Drain--Source On--Voltage (VGS = 10 Vdc, ID = 2 Adc) Forward Transconductance (VDS = 10 Vdc, ID = 2 Adc) VGS(th) VGS(Q) VDS(on) gfs 2.5 -- -- -- 2.9 3.9 0.25 5 3.5 -- -- -- Vdc Vdc Vdc S
Dynamic Characteristics (1) Reverse Transfer Capacitance (VDS = 28 Vdc 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc) Crss -- 1.7 -- pF
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 850 mA, Pout = 19 W Avg., f = 2112.5 MHz, 2--carrier W--CDMA, 3.84 MHz Channel Bandwidth Carriers. ACPR measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset. IM3 measured in 3.84 MHz Bandwidth @ 10 MHz Offset. PAR = 8.5 dB @ 0.01% Probability on CCDF. Power Gain Drain Efficiency Intermodulation Distortion Adjacent Channel Power Ratio Input Return Loss 1. Part is internally matched both on input and output. Gps D IM3 ACPR IRL 12.5 24 -- -- -- 14.5 26 --37.5 --40.5 --15 -- -- --35 --38 --9 dB % dBc dBc dB
MRF5S21090HR3 MRF5S21090HSR3 2 RF Device Data Freescale Semiconductor
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
C3 R1 VBIAS R2 C4 C5 C9 C6 Z4 Z1 Z2 C14 C1 Z5 Z3 Z6 Z7 Z14 Z8 DUT Z9 Z10 Z11 Z12 Z13 Z15 C2 Z16 Z17 Z18 Z19 Z20 Z21 C10 C7 C8 W1 C11 C12 + C13 R3 R4 VSUPPLY
RF INPUT
RF OUTPUT
C15
Z1 Z2 Z3 Z4 Z5 Z6 Z7 Z8 Z9 Z10 Z11
1.0856 x 0.080 Microstrip 0.130 x 0.080 Microstrip 0.230 x 0.080 Microstrip 0.347 x 0.208 Microstrip 0.090 x 0.208 Microstrip 0.650 x 0.176 Taper 0.623 x 0.610 Microstrip 0.044 x 0.881 Microstrip 0.044 x 0.869 Microstrip 1.076 x 0.446 Microstrip 0.320 x 0.393 Microstrip
Z12 Z13 Z14 Z15 Z16 Z17 Z18 Z19 Z20 Z21 PCB
0.609 x 0.220 Microstrip 0.290 x 0.106 Microstrip 0.290 x 0.106 Microstrip 0.080 x 0.025 Microstrip 1.080 x 0.160 Microstrip 0.180 x 0.080 Microstrip 0.260 x 0.147 Microstrip 0.500 x 0.080 Microstrip 0.199 x 0.147 Microstrip 0.365 x 0.080 Microstrip Arlon GX0300--55--22, 0.03, r = 2.55
Figure 1. MRF5S21090HR3(HSR3) Test Circuit Schematic
Table 5. MRF5S21090HR3(HSR3) Test Circuit Component Designations and Values
Part Description 9.1 pF Chip Capacitor 8.2 pF Chip Capacitor 2.0 pF Chip Capacitor 0.1 F Chip Capacitors 5.6 pF Chip Capacitor 5.1 pF Chip Capacitor 7.5 pF Chip Capacitor 1.2 pF Chip Capacitor 0.56 F Chip Capacitors 1000 pF Chip Capacitor 470 F, 35 V Electrolytic Capacitor 0.4 - 2.5 Variable Capacitors, Gigatrim 1 k, 1/4 W Chip Resistor 560 k, 1/4 W Chip Resistor 12 , 1/4 W Chip Resistors Wire Strap Part Number ATC100B9R1CT500XT ATC100B8R2CT500XT ATC100B2R0BT500XT CDR33BX104AKYS ATC100B5R6CT500XT ATC100B5R1CT500XT ATC100B7R5JT500XT ATC100B1R2BT500XT 700A561MT150XT ATC100B102JT500XT EKME630ELL471MK25S 27281SL CRCW12061001FKEA CRCW12065600FKEA CRCW120612R0FKEA Manufacturer ATC ATC ATC Kemet ATC ATC ATC ATC ATC ATC Nippon Chemi--Con Johanson Vishay Vishay Vishay C1 C2 C3 C4, C12 C5 C6 C7 C8 C9, C10 C11 C13 C14, C15 R1 R2 R3, R4 W1
MRF5S21090HR3 MRF5S21090HSR3 RF Device Data Freescale Semiconductor 3
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
LIFETIME BUY
C3 C5 VGG R2 R1 R3 C4 C9 C10
C11 C6 C12
R4 W1
VDD
C1 C2 C14 CUT OUT AREA C15
MRF5S21090 Rev 5
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have no impact on form, fit or function of the current product.
Figure 2. MRF5S21090HR3(HSR3) Test Circuit Component Layout
MRF5S21090HR3 MRF5S21090HSR3 4 RF Device Data Freescale Semiconductor
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
C7 C8
C13
LIFETIME BUY
TYPICAL CHARACTERISTICS
15 14 13 G ps , POWER GAIN (dB) 12 11 10 9 8 7 6 IM3 ACPR 2100 2120 2140 2160 2180 IRL 3.84 MHz Channel Bandwidth, PAR = 8.5 dB @ 0.01% Probability (CCDF) Gps D VDD = 28 Vdc, Pout = 19 W (Avg.), IDQ = 850 mA 2--Carrier W--CDMA, 10 MHz Carrier Spacing 40 D, DRAIN EFFICIENCY (%)
30 25 20 --20 --25 --30 --35 --40 --45 2200
IM3 (dBc), ACPR (dBc)
--10 --15 --20 --25 --30 --35
5 2080
f, FREQUENCY (MHz)
LIFETIME BUY
Figure 3. 2-Carrier W-CDMA Broadband Performance
16
IDQ = 1200 mA 1000 mA
VDD = 28 Vdc f1 = 2135 MHz, f2 = 2145 MHz Two--Tone Measurement, 10 MHz Tone Spacing
IMD,THIRD ORDER INTERMODULATION DISTORTION (dBc)
17
--15 --20 --25 --30 --35 --40 --45 --50
VDD = 28 Vdc f1 = 2135 MHz, f2 = 2145 MHz Two--Tone Measurement, 10 MHz Tone Spacing
15
850 mA
IDQ = 450 mA 1200 mA
14
650 mA
13
450 mA
1000 mA 650 mA 1 10 Pout, OUTPUT POWER (WATTS) PEP 850 mA 100
12 1 10 Pout, OUTPUT POWER (WATTS) PEP 100
Figure 4. Two-Tone Power Gain versus Output Power
Figure 5. 3rd Order Intermodulation Distortion versus Output Power
IMD, INTERMODULATION DISTORTION (dBc)
--20 --25 --30 --35 --40 --45 7th Order --50 --55 --60 0.1 VDD = 28 Vdc, Pout = 90 W (PEP), IDQ = 850 mA Two--Tone Measurements (f1 + f2)/2 = Center Frequency of 2140 MHz 1 TWO--TONE SPACING (MHz) 10 5th Order 3rd Order Pout , OUTPUT POWER (dBm)
57 55 53 51 P1dB = 50.47 dBm (111.4 W) Actual 49 47 45 30 32 34 36 38 40 42 Pin, INPUT POWER (dBm) VDD = 28 Vdc, IDQ = 850 mA Pulsed CW, 8 sec(on), 1 msec(off) f = 2140 MHz Ideal P3dB = 51.17 dBm (130.9 W)
Figure 6. Intermodulation Distortion Products versus Tone Spacing
Figure 7. Pulse CW Output Power versus Input Power
MRF5S21090HR3 MRF5S21090HSR3 RF Device Data Freescale Semiconductor 5
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
35
G ps , POWER GAIN (dB)
IRL, INPUT RETURN LOSS (dB)
TYPICAL CHARACTERISTICS
D, DRAIN EFFICIENCY (%), Gps, POWER GAIN (dB) 40 35 30 25 20 15 10 5 0 1 10 Pout, POWER (WATTS) W--CDMA Gps IM3 ACPR VDD = 28 Vdc, IDQ = 850 mA, f1 = 2135 MHz, f2 = 2145 MHz, 2 x W--CDMA, 10 MHz @ 3.84 MHz Bandwidth, PAR = 8.5 dB @ 0.01% Probability (CCDF) D --15 MTTF FACTOR (HOURS x AMPS2) --20 IM3 (dBc), ACPR (dBc) --25 --30 --35 --40 --45 --50 --55 109
108
107
106 100
120
140
160
180
200
220
TJ, JUNCTION TEMPERATURE (C) This above graph displays calculated MTTF in hours x ampere2 drain current. Life tests at elevated temperatures have correlated to better than 10% of the theoretical prediction for metal failure. Divide MTTF factor by ID2 for MTTF in a particular application.
Figure 8. 2-Carrier W-CDMA ACPR, IM3, Power Gain and Drain Efficiency versus Output Power
Figure 9. MTTF Factor versus Junction Temperature
W-CDMA TEST SIGNAL
--20 --30 10 1 (dB) --40 --50 --60 --70 --80 W--CDMA. ACPR Measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset. IM3 Measured in 3.84 MHz Bandwidth @ 10 MHz Offset. PAR = 8.5 dB @ 0.01% Probability on CCDF 0 2 4 6 8 10 --90 --100 --110 --120 --25 --ACPR in +ACPR in 3.84 MHz BW 3.84 MHz BW --IM3 in 3.84 MHz BW --20 --15 --10 --5 0 5 10
100
3.84 MHz Channel BW
0.1
0.01
0.001 .0001
+IM3 in 3.84 MHz BW 15 20 25
PEAK--TO--AVERAGE (dB)
f, FREQUENCY (MHz)
Figure 10. CCDF W-CDMA 3GPP, Test Model 1, 64 DPCH, 67% Clipping, Single Carrier Test Signal
Figure 11. 2-Carrier W-CDMA Spectrum
MRF5S21090HR3 MRF5S21090HSR3 6 RF Device Data Freescale Semiconductor
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
LIFETIME BUY
f = 2200 MHz Zload
f = 2100 MHz Zo = 10
f = 2200 MHz f = 2100 MHz
Zsource
VDD = 28 Vdc, IDQ = 850 mA, Pout = 19 W Avg. f MHz 2100 2120 2160 2200 Zsource 3.4 -- j5.1 3.2 -- j5.4 3.0 -- j4.4 3.0 -- j4.0 Zload 2.4 -- j2.0 2.2 -- j2.1 2.1 -- j1.9 1.8 -- j1.6
Zsource = Test circuit impedance as measured from gate to ground. Zload = Test circuit impedance as measured from drain to ground.
Input Matching Network
Device Under Test
Output Matching Network
Z
source
Z
load
Figure 12. Series Equivalent Source and Load Impedance MRF5S21090HR3 MRF5S21090HSR3 RF Device Data Freescale Semiconductor 7
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
LIFETIME BUY
PACKAGE DIMENSIONS
B G
1 2X
Q bbb
M
TA
M
B
M
3
NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M--1994. 2. CONTROLLING DIMENSION: INCH. 3. DELETED 4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY FROM PACKAGE BODY. DIM A B C D E F G H K M N Q R S aaa bbb ccc INCHES MIN MAX 1.335 1.345 0.380 0.390 0.125 0.170 0.495 0.505 0.035 0.045 0.003 0.006 1.100 BSC 0.057 0.067 0.170 0.210 0.774 0.786 0.772 0.788 .118 .138 0.365 0.375 0.365 0.375 0.005 REF 0.010 REF 0.015 REF MILLIMETERS MIN MAX 33.91 34.16 9.65 9.91 3.18 4.32 12.57 12.83 0.89 1.14 0.08 0.15 27.94 BSC 1.45 1.70 4.32 5.33 19.66 19.96 19.60 20.00 3.00 3.51 9.27 9.53 9.27 9.52 0.127 REF 0.254 REF 0.381 REF
B
(FLANGE)
2
K
D bbb
M
TA
M
B
M
M
(INSULATOR)
R
M
(LID)
bbb N H C
(LID)
M
TA
B
M
ccc
M
TA
M
B
M
S
M
(INSULATOR)
ccc
TA
M
B
M
aaa
M
TA
M
B
M
F E A A
(FLANGE)
T
SEATING PLANE
STYLE 1: PIN 1. DRAIN 2. GATE 3. SOURCE
CASE 465-06 ISSUE G NI-780 MRF5S21090HR3
4X U (FLANGE)
B
1
4X Z (LID)
NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M--1994. 2. CONTROLLING DIMENSION: INCH. 3. DELETED 4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY FROM PACKAGE BODY. DIM A B C D E F H K M N R S U Z aaa bbb ccc INCHES MIN MAX 0.805 0.815 0.380 0.390 0.125 0.170 0.495 0.505 0.035 0.045 0.003 0.006 0.057 0.067 0.170 0.210 0.774 0.786 0.772 0.788 0.365 0.375 0.365 0.375 -----0.040 -----0.030 0.005 REF 0.010 REF 0.015 REF MILLIMETERS MIN MAX 20.45 20.70 9.65 9.91 3.18 4.32 12.57 12.83 0.89 1.14 0.08 0.15 1.45 1.70 4.32 5.33 19.61 20.02 19.61 20.02 9.27 9.53 9.27 9.52 -----1.02 -----0.76 0.127 REF 0.254 REF 0.381 REF
(FLANGE)
B
2
2X
K
D bbb
M
TA
M
B
M
N
(LID)
R
M
(LID)
ccc M H
3
TA
M
B
M
ccc aaa
M
TA TA
M
B B
M
(INSULATOR)
S
M
(INSULATOR) M
bbb C
M
TA
B
M
M
M
F E A A
(FLANGE)
STYLE 1: PIN 1. DRAIN 2. GATE 5. SOURCE
T
SEATING PLANE
CASE 465A-06 ISSUE H NI-780S MRF5S21090HSR3
MRF5S21090HR3 MRF5S21090HSR3 8 RF Device Data Freescale Semiconductor
PRODUCT DOCUMENTATION
Refer to the following documents to aid your design process. Application Notes * AN1955: Thermal Measurement Methodology of RF Power Amplifiers Engineering Bulletins * EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document.
Revision 3 Date Oct. 2008 Description * Modified data sheet to reflect RF Test Reduction described in Product and Process Change Notification number, PCN12779, p. 1, 2 * Updated Part Numbers in Table 5, Component Designations and Values, to RoHS compliant part numbers, p. 3 * Added Product Documentation and Revision History, p. 9
MRF5S21090HR3 MRF5S21090HSR3 RF Device Data Freescale Semiconductor 9
How to Reach Us:
Home Page: www.freescale.com Web Support: http://www.freescale.com/support USA/Europe or Locations Not Listed: Freescale Semiconductor, Inc. Technical Information Center, EL516 2100 East Elliot Road Tempe, Arizona 85284 1--800--521--6274 or +1--480--768--2130 www.freescale.com/support Europe, Middle East, and Africa: Freescale Halbleiter Deutschland GmbH Technical Information Center Schatzbogen 7 81829 Muenchen, Germany +44 1296 380 456 (English) +46 8 52200080 (English) +49 89 92103 559 (German) +33 1 69 35 48 48 (French) www.freescale.com/support Japan: Freescale Semiconductor Japan Ltd. Headquarters ARCO Tower 15F 1--8--1, Shimo--Meguro, Meguro--ku, Tokyo 153--0064 Japan 0120 191014 or +81 3 5437 9125 support.japan@freescale.com Asia/Pacific: Freescale Semiconductor China Ltd. Exchange Building 23F No. 118 Jianguo Road Chaoyang District Beijing 100022 China +86 10 5879 8000 support.asia@freescale.com For Literature Requests Only: Freescale Semiconductor Literature Distribution Center P.O. Box 5405 Denver, Colorado 80217 1--800--441--2447 or +1--303--675--2140 Fax: +1--303--675--2150 LDCForFreescaleSemiconductor@hibbertgroup.com
Information in this document is provided solely to enable system and software implementers to use Freescale Semiconductor products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes without further notice to any products herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. "Typical" parameters that may be provided in Freescale Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including "Typicals", must be validated for each customer application by customer's technical experts. Freescale Semiconductor does not convey any license under its patent rights nor the rights of others. Freescale Semiconductor products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Freescale Semiconductor product could create a situation where personal injury or death may occur. Should Buyer purchase or use Freescale Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Freescale Semiconductor was negligent regarding the design or manufacture of the part. Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. (c) Freescale Semiconductor, Inc. 2008. All rights reserved.
MRF5S21090HR3 MRF5S21090HSR3
Document Number: MRF5S21090H Rev. 10 3, 10/2008
RF Device Data Freescale Semiconductor


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